APA引文

MIAO, C., & ENGINEERING, E. &. C. (2023). RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES.

Chicago Style Citation

MIAO, CAI, and ELECTRICAL & COMPUTER ENGINEERING. RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. 2023.

MLA引文

MIAO, CAI, and ELECTRICAL & COMPUTER ENGINEERING. RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. 2023.

警告：這些引文格式不一定是100％准確.