MIAO, C., & ENGINEERING, E. &. C. (2023). RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES.
استشهاد بنمط شيكاغوMIAO, CAI, و ELECTRICAL & COMPUTER ENGINEERING. RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. 2023.
MLA استشهادMIAO, CAI, و ELECTRICAL & COMPUTER ENGINEERING. RELIABILITY CHARACTERIZATION AND MODELING FOR HIGH VOLTAGE LDMOS DEVICES. 2023.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.