JING, J., & ENGINEERING, E. &. C. (2011). Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices.
استشهاد بنمط شيكاغوJING, JIANG, و ELECTRICAL & COMPUTER ENGINEERING. Electromigration-induced Failure Characteristics of GMR Spin- Valves and Magnetic Multilayers for the Electrical Reliability of Spintronic Devices. 2011.
MLA استشهادJING, JIANG, و ELECTRICAL & COMPUTER ENGINEERING. Electromigration-induced Failure Characteristics of GMR Spin- Valves and Magnetic Multilayers for the Electrical Reliability of Spintronic Devices. 2011.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.