Liu, J., Cao, L., Xie, M., Goh, T., Tang, Y., & ENGINEERING, I. &. S. (2014). A general Weibull model for reliability analysis under different failure criteria - Application on anisotropic conductive adhesive joining technology.

Liu, J., L. Cao, M. Xie, T.-N Goh, Y. Tang, و INDUSTRIAL & SYSTEMS ENGINEERING. A General Weibull Model for Reliability Analysis Under Different Failure Criteria - Application On Anisotropic Conductive Adhesive Joining Technology. 2014.

Liu, J., et al. A General Weibull Model for Reliability Analysis Under Different Failure Criteria - Application On Anisotropic Conductive Adhesive Joining Technology. 2014.