Xu, M., Tan, C., Li, M., & ENGINEERING, E. &. C. (2014). Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides.
Chicago Style CitationXu, M., C. Tan, M. Li, and ELECTRICAL & COMPUTER ENGINEERING. Extended Arrhenius Law of Time-to-breakdown of Ultrathin Gate Oxides. 2014.
MLA CitationXu, M., C. Tan, M. Li, and ELECTRICAL & COMPUTER ENGINEERING. Extended Arrhenius Law of Time-to-breakdown of Ultrathin Gate Oxides. 2014.
Warning: These citations may not always be 100% accurate.