APA引文

Xu, M., Tan, C., Li, M., & ENGINEERING, E. &. C. (2014). Extended Arrhenius law of time-to-breakdown of ultrathin gate oxides.

Chicago Style Citation

Xu, M., C. Tan, M. Li, and ELECTRICAL & COMPUTER ENGINEERING. Extended Arrhenius Law of Time-to-breakdown of Ultrathin Gate Oxides. 2014.

MLA引文

Xu, M., C. Tan, M. Li, and ELECTRICAL & COMPUTER ENGINEERING. Extended Arrhenius Law of Time-to-breakdown of Ultrathin Gate Oxides. 2014.

警告：這些引文格式不一定是100％准確.