Hong, Y., Yeow, Y., Chim, W., Wong, K., Kopanski, J., & ENGINEERING, E. &. C. (2014). Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement.

Hong, Y.D., Y.T Yeow, W.-K Chim, K.-M Wong, J.J Kopanski, and ELECTRICAL & COMPUTER ENGINEERING. Influence of Interface Traps and Surface Mobility Degradation On Scanning Capacitance Microscopy Measurement. 2014.

Hong, Y.D., et al. Influence of Interface Traps and Surface Mobility Degradation On Scanning Capacitance Microscopy Measurement. 2014.