Hong, Y., Yeow, Y., Chim, W., Wong, K., Kopanski, J., & ENGINEERING, E. &. C. (2014). Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement.

Hong, Y.D., Y.T Yeow, W.-K Chim, K.-M Wong, J.J Kopanski, و ELECTRICAL & COMPUTER ENGINEERING. Influence of Interface Traps and Surface Mobility Degradation On Scanning Capacitance Microscopy Measurement. 2014.

Hong, Y.D., et al. Influence of Interface Traps and Surface Mobility Degradation On Scanning Capacitance Microscopy Measurement. 2014.