Yeap, K., Zeng, K., Chi, D., & ENGINEERING, M. (2014). Determining the interfacial toughness of low-k films on Si substrate by wedge indentation: Further studies.
Chicago Style CitationYeap, K.B., K. Zeng, D. Chi, and MECHANICAL ENGINEERING. Determining the Interfacial Toughness of Low-k Films On Si Substrate By Wedge Indentation: Further Studies. 2014.
MLA CitationYeap, K.B., K. Zeng, D. Chi, and MECHANICAL ENGINEERING. Determining the Interfacial Toughness of Low-k Films On Si Substrate By Wedge Indentation: Further Studies. 2014.
Warning: These citations may not always be 100% accurate.