Ling, C., Yeow, Y., Ah, L., & ENGINEERING, E. (2014). Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements.
Chicago Style CitationLing, C.H., Y.T Yeow, L.K Ah, and ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
MLA引文Ling, C.H., Y.T Yeow, L.K Ah, and ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
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