Ling, C., Yeow, Y., Ah, L., & ENGINEERING, E. (2014). Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements.
استشهاد بنمط شيكاغوLing, C.H., Y.T Yeow, L.K Ah, و ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
MLA استشهادLing, C.H., Y.T Yeow, L.K Ah, و ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
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