Ling, C., Yeow, Y., Ah, L., & ENGINEERING, E. (2014). Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements.
Chicago Style CitationLing, C.H., Y.T Yeow, L.K Ah, and ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
MLA CitationLing, C.H., Y.T Yeow, L.K Ah, and ELECTRICAL ENGINEERING. Characterization of Charge Trapping in Submicrometer NMOSFET's By Gate Capacitance Measurements. 2014.
Warning: These citations may not always be 100% accurate.