Tan, L., Huynh, F., & ENGINEERING, E. (2014). Determination of minority carrier diffusion lengths in semiconductor wafers with non-uniform carrier lifetimes by the surface photovoltage technique.
Chicago Style CitationTan, L.S., F.N.L Huynh, and ELECTRICAL ENGINEERING. Determination of Minority Carrier Diffusion Lengths in Semiconductor Wafers With Non-uniform Carrier Lifetimes By the Surface Photovoltage Technique. 2014.
MLA CitationTan, L.S., F.N.L Huynh, and ELECTRICAL ENGINEERING. Determination of Minority Carrier Diffusion Lengths in Semiconductor Wafers With Non-uniform Carrier Lifetimes By the Surface Photovoltage Technique. 2014.
Warning: These citations may not always be 100% accurate.