Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
Solid State Electronics
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sg-nus-scholar.10635-622142024-11-08T18:01:37Z Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures Ling, C.H. Kwok, C.Y. Chan, E.G. Tay, T.M. ELECTRICAL ENGINEERING Solid State Electronics 29 9 995-997 SSELA 2014-06-17T06:48:38Z 2014-06-17T06:48:38Z 1986-09 Article Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository. 00381101 http://scholarbank.nus.edu.sg/handle/10635/62214 NOT_IN_WOS Scopus |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Ling, C.H. Kwok, C.Y. Chan, E.G. Tay, T.M. |
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Ling, C.H. Kwok, C.Y. Chan, E.G. Tay, T.M. |
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Ling, C.H. Kwok, C.Y. Chan, E.G. Tay, T.M. Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
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Ling, C.H. |
title |
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
title_short |
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
title_full |
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
title_fullStr |
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
title_full_unstemmed |
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures |
title_sort |
frequency dependence of mos capacitance in strong inversion and at elevated temperatures |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/62214 |
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