Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures

Solid State Electronics

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Bibliographic Details
Main Authors: Ling, C.H., Kwok, C.Y., Chan, E.G., Tay, T.M.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/62214
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-622142024-11-08T18:01:37Z Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures Ling, C.H. Kwok, C.Y. Chan, E.G. Tay, T.M. ELECTRICAL ENGINEERING Solid State Electronics 29 9 995-997 SSELA 2014-06-17T06:48:38Z 2014-06-17T06:48:38Z 1986-09 Article Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository. 00381101 http://scholarbank.nus.edu.sg/handle/10635/62214 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Solid State Electronics
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Ling, C.H.
Kwok, C.Y.
Chan, E.G.
Tay, T.M.
format Article
author Ling, C.H.
Kwok, C.Y.
Chan, E.G.
Tay, T.M.
spellingShingle Ling, C.H.
Kwok, C.Y.
Chan, E.G.
Tay, T.M.
Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
author_sort Ling, C.H.
title Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
title_short Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
title_full Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
title_fullStr Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
title_full_unstemmed Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
title_sort frequency dependence of mos capacitance in strong inversion and at elevated temperatures
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/62214
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