أرسل هذا في رسالة قصيرة: Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs

 _    _      ___     _    _      ___       _____  
| |  | ||   / _ \\  | |  | ||   / _ \\    / ___// 
| |/\| ||  / //\ \\ | |/\| ||  | / \ ||   \___ \\ 
|  /\  || |  ___  |||  /\  ||  | \_/ ||   /    // 
|_// \_|| |_||  |_|||_// \_||   \___//   /____//  
`-`   `-` `-`   `-` `-`   `-`   `---`   `-----`