Ling, C., Samudra, G., Seah, B., & ENGINEERING, E. (2014). Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs.
استشهاد بنمط شيكاغوLing, C.H., G.S Samudra, B.P Seah, و ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.
MLA استشهادLing, C.H., G.S Samudra, B.P Seah, و ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.