Ling, C., Samudra, G., Seah, B., & ENGINEERING, E. (2014). Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs.
Chicago Style CitationLing, C.H., G.S Samudra, B.P Seah, and ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.
MLA CitationLing, C.H., G.S Samudra, B.P Seah, and ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.
Warning: These citations may not always be 100% accurate.