APA引文

Ling, C., Samudra, G., Seah, B., & ENGINEERING, E. (2014). Simulation of logarithmic time dependence of hot carrier degradation in PMOSFETs.

Chicago Style Citation

Ling, C.H., G.S Samudra, B.P Seah, and ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.

MLA引文

Ling, C.H., G.S Samudra, B.P Seah, and ELECTRICAL ENGINEERING. Simulation of Logarithmic Time Dependence of Hot Carrier Degradation in PMOSFETs. 2014.

警告：這些引文格式不一定是100％准確.