Kolachina, S., Phang, J., Chan, D., & ENGINEERING, E. (2014). Single contact electron beam induced currents (scebic) in semiconductor junctions. Part I: Quantitative verification of scebic model.
Chicago Style CitationKolachina, S., J.C.H Phang, D.S.H Chan, and ELECTRICAL ENGINEERING. Single Contact Electron Beam Induced Currents (scebic) in Semiconductor Junctions. Part I: Quantitative Verification of Scebic Model. 2014.
MLA引文Kolachina, S., J.C.H Phang, D.S.H Chan, and ELECTRICAL ENGINEERING. Single Contact Electron Beam Induced Currents (scebic) in Semiconductor Junctions. Part I: Quantitative Verification of Scebic Model. 2014.
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