Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion Microscopy
10.1109/IPFA.2009.5232596
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Main Authors: | Tiedemann, A.-K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/69239 |
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Institution: | National University of Singapore |
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