Zmeck, M., Balk, L., Pugatschow, A., Niedernostheide, F., Schulze, H., Osipowicz, T., . . . ENGINEERING, E. &. C. (2014). Analysis of premature breakdown in high-power devices using IBIC microscopy.
Chicago Style CitationZmeck, M., et al. Analysis of Premature Breakdown in High-power Devices Using IBIC Microscopy. 2014.
MLA CitationZmeck, M., et al. Analysis of Premature Breakdown in High-power Devices Using IBIC Microscopy. 2014.
Warning: These citations may not always be 100% accurate.