Zmeck, M., Balk, L., Pugatschow, A., Niedernostheide, F., Schulze, H., Osipowicz, T., . . . ENGINEERING, E. &. C. (2014). Analysis of premature breakdown in high-power devices using IBIC microscopy.
Chicago Style CitationZmeck, M., et al. Analysis of Premature Breakdown in High-power Devices Using IBIC Microscopy. 2014.
MLA引文Zmeck, M., et al. Analysis of Premature Breakdown in High-power Devices Using IBIC Microscopy. 2014.
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