Goh, S., Yim, K., Phang, J., Balk, L., & ENGINEERING, E. &. C. (2014). Enhanced pixel by pixel emissivity correction for thermal microscopy.
Chicago Style CitationGoh, S.H., K.H Yim, J.C.H Phang, L.J Balk, and ELECTRICAL & COMPUTER ENGINEERING. Enhanced Pixel By Pixel Emissivity Correction for Thermal Microscopy. 2014.
MLA引文Goh, S.H., et al. Enhanced Pixel By Pixel Emissivity Correction for Thermal Microscopy. 2014.
警告:這些引文格式不一定是100%准確.