Choi, W., Han, L., Loo, F., & ENGINEERING, E. (2014). Electrical characterization of radio frequency sputtered hydrogenated amorphous silicon carbide films.
استشهاد بنمط شيكاغوChoi, W.K., L.J Han, F.L Loo, و ELECTRICAL ENGINEERING. Electrical Characterization of Radio Frequency Sputtered Hydrogenated Amorphous Silicon Carbide Films. 2014.
MLA استشهادChoi, W.K., L.J Han, F.L Loo, و ELECTRICAL ENGINEERING. Electrical Characterization of Radio Frequency Sputtered Hydrogenated Amorphous Silicon Carbide Films. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.