APA引文

Sheng, H., Chua, S., & ENGINEERING, E. (2014). Interface roughness effects on the currents of resonant tunnelling hot electron transistor.

Chicago Style Citation

Sheng, Hanyu, Soo-Jin Chua, and ELECTRICAL ENGINEERING. Interface Roughness Effects On the Currents of Resonant Tunnelling Hot Electron Transistor. 2014.

MLA引文

Sheng, Hanyu, Soo-Jin Chua, and ELECTRICAL ENGINEERING. Interface Roughness Effects On the Currents of Resonant Tunnelling Hot Electron Transistor. 2014.

警告：這些引文格式不一定是100％准確.