Sheng, H., Chua, S., & ENGINEERING, E. (2014). Interface roughness effects on the currents of resonant tunnelling hot electron transistor.
Chicago Style CitationSheng, Hanyu, Soo-Jin Chua, and ELECTRICAL ENGINEERING. Interface Roughness Effects On the Currents of Resonant Tunnelling Hot Electron Transistor. 2014.
MLA CitationSheng, Hanyu, Soo-Jin Chua, and ELECTRICAL ENGINEERING. Interface Roughness Effects On the Currents of Resonant Tunnelling Hot Electron Transistor. 2014.
Warning: These citations may not always be 100% accurate.