Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

Semiconductor Science and Technology

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Bibliographic Details
Main Authors: Teh, G.L., Chim, W.K., Swee, Y.K., Co, Y.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/81210
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Institution: National University of Singapore
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Summary:Semiconductor Science and Technology

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