APA引文

Guan, S., Xie, P., & ENGINEERING, E. (2014). A golden block self-generating scheme for continuous patterned wafer inspections.

Chicago Style Citation

Guan, S.-U., P. Xie, and ELECTRICAL ENGINEERING. A Golden Block Self-generating Scheme for Continuous Patterned Wafer Inspections. 2014.

MLA引文

Guan, S.-U., P. Xie, and ELECTRICAL ENGINEERING. A Golden Block Self-generating Scheme for Continuous Patterned Wafer Inspections. 2014.

警告：這些引文格式不一定是100％准確.