Guan, S., Xie, P., & ENGINEERING, E. (2014). A golden block self-generating scheme for continuous patterned wafer inspections.
استشهاد بنمط شيكاغوGuan, S.-U., P. Xie, و ELECTRICAL ENGINEERING. A Golden Block Self-generating Scheme for Continuous Patterned Wafer Inspections. 2014.
MLA استشهادGuan, S.-U., P. Xie, و ELECTRICAL ENGINEERING. A Golden Block Self-generating Scheme for Continuous Patterned Wafer Inspections. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.