APA引文

Siah, S., Hoex, B., Aberle, A., & ENGINEERING, E. &. C. (2014). Accurate characterization of thin films on rough surfaces by spectroscopic ellipsometry.

Chicago Style Citation

Siah, S.C., B. Hoex, A.G Aberle, and ELECTRICAL & COMPUTER ENGINEERING. Accurate Characterization of Thin Films On Rough Surfaces By Spectroscopic Ellipsometry. 2014.

MLA引文

Siah, S.C., B. Hoex, A.G Aberle, and ELECTRICAL & COMPUTER ENGINEERING. Accurate Characterization of Thin Films On Rough Surfaces By Spectroscopic Ellipsometry. 2014.

警告：這些引文格式不一定是100％准確.