Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices

10.1063/1.3475721

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Main Authors: Fang, L.W.-W., Zhang, Z., Zhao, R., Pan, J., Li, M., Shi, L., Chong, T.-C., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82353
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-823532023-10-30T23:07:09Z Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices Fang, L.W.-W. Zhang, Z. Zhao, R. Pan, J. Li, M. Shi, L. Chong, T.-C. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1063/1.3475721 Journal of Applied Physics 108 5 - JAPIA 2014-10-07T04:28:21Z 2014-10-07T04:28:21Z 2010-09-01 Article Fang, L.W.-W., Zhang, Z., Zhao, R., Pan, J., Li, M., Shi, L., Chong, T.-C., Yeo, Y.-C. (2010-09-01). Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices. Journal of Applied Physics 108 (5) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3475721 00218979 http://scholarbank.nus.edu.sg/handle/10635/82353 000282478900041 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.3475721
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Fang, L.W.-W.
Zhang, Z.
Zhao, R.
Pan, J.
Li, M.
Shi, L.
Chong, T.-C.
Yeo, Y.-C.
format Article
author Fang, L.W.-W.
Zhang, Z.
Zhao, R.
Pan, J.
Li, M.
Shi, L.
Chong, T.-C.
Yeo, Y.-C.
spellingShingle Fang, L.W.-W.
Zhang, Z.
Zhao, R.
Pan, J.
Li, M.
Shi, L.
Chong, T.-C.
Yeo, Y.-C.
Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
author_sort Fang, L.W.-W.
title Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
title_short Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
title_full Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
title_fullStr Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
title_full_unstemmed Fermi-level pinning and charge neutrality level in nitrogen-doped Ge 2 Sb2 Te5: Characterization and application in phase change memory devices
title_sort fermi-level pinning and charge neutrality level in nitrogen-doped ge 2 sb2 te5: characterization and application in phase change memory devices
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/82353
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