Zheng, J., Ceder, G., Chim, W., & ENGINEERING, E. &. C. (2014). First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials.
استشهاد بنمط شيكاغوZheng, J.X., G. Ceder, W.K Chim, و ELECTRICAL & COMPUTER ENGINEERING. First-principles Study On the Concentrations of Native Point Defects in High-dielectric-constant Binary Oxide Materials. 2014.
MLA استشهادZheng, J.X., G. Ceder, W.K Chim, و ELECTRICAL & COMPUTER ENGINEERING. First-principles Study On the Concentrations of Native Point Defects in High-dielectric-constant Binary Oxide Materials. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.