Zheng, J., Ceder, G., Chim, W., & ENGINEERING, E. &. C. (2014). First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materials.
Chicago Style CitationZheng, J.X., G. Ceder, W.K Chim, and ELECTRICAL & COMPUTER ENGINEERING. First-principles Study On the Concentrations of Native Point Defects in High-dielectric-constant Binary Oxide Materials. 2014.
MLA引文Zheng, J.X., G. Ceder, W.K Chim, and ELECTRICAL & COMPUTER ENGINEERING. First-principles Study On the Concentrations of Native Point Defects in High-dielectric-constant Binary Oxide Materials. 2014.
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