發送短信 : Gate-induced drain leakage current enhanced by plasma charging damage

  _____      ___      _  _      ___      _  __  
 |__  //    / _ \\   | \| ||   / _ \\   | |/ // 
   / //    | / \ ||  |  ' ||  | / \ ||  | ' //  
  / //__   | \_/ ||  | .  ||  | \_/ ||  | . \\  
 /_____||   \___//   |_|\_||   \___//   |_|\_\\ 
 `-----`    `---`    `-` -`    `---`    `-` --`