Samanta, S., Chatterjee, S., Maikap, S., Bera, L., Banerjee, H., Maiti, C., & ENGINEERING, E. &. C. (2014). Interface properties and reliability of ultrathin oxynitride films grown on strained Si1-xGex substrates.
Chicago Style CitationSamanta, S.K., S. Chatterjee, S. Maikap, L.K Bera, H.D Banerjee, C.K Maiti, and ELECTRICAL & COMPUTER ENGINEERING. Interface Properties and Reliability of Ultrathin Oxynitride Films Grown On Strained Si1-xGex Substrates. 2014.
MLA引文Samanta, S.K., et al. Interface Properties and Reliability of Ultrathin Oxynitride Films Grown On Strained Si1-xGex Substrates. 2014.
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