APA引文

Tan, C., Chor, E., Lee, H., Liu, J., Quek, E., Chan, L., & ENGINEERING, E. &. C. (2014). Leakage suppression of gated diodes fabricated under low-temperature annealing with substitutional carbon Si1-yCy incorporation.

Chicago Style Citation

Tan, C.F., E.F Chor, H. Lee, J. Liu, E. Quek, L. Chan, and ELECTRICAL & COMPUTER ENGINEERING. Leakage Suppression of Gated Diodes Fabricated Under Low-temperature Annealing With Substitutional Carbon Si1-yCy Incorporation. 2014.

MLA引文

Tan, C.F., et al. Leakage Suppression of Gated Diodes Fabricated Under Low-temperature Annealing With Substitutional Carbon Si1-yCy Incorporation. 2014.