Lim, Y., Xiong, Y., Singh, N., Yang, R., Jiang, Y., Chan, D., . . . ENGINEERING, E. &. C. (2014). Random telegraph signal noise in gate-all-around Si-FinFET with ultranarrow body.
استشهاد بنمط شيكاغوLim, Y.F., et al. Random Telegraph Signal Noise in Gate-all-around Si-FinFET With Ultranarrow Body. 2014.
MLA استشهادLim, Y.F., et al. Random Telegraph Signal Noise in Gate-all-around Si-FinFET With Ultranarrow Body. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.