Shen, C., Li, M., Foo, C., Yang, T., Huang, D., Yaps, A., . . . ENGINEERING, E. &. C. (2014). Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric.

Shen, C., M.-F Li, C.E Foo, T. Yang, D.M Huang, A. Yaps, G.S Samudra, Y.-C Yeo, و ELECTRICAL & COMPUTER ENGINEERING. Characterization and Physical Origin of Fast Vth Transient in NBTI of PMOSFETs With SiON Dielectric. 2014.

Shen, C., et al. Characterization and Physical Origin of Fast Vth Transient in NBTI of PMOSFETs With SiON Dielectric. 2014.