APA引文

Shen, C., Li, M., Foo, C., Yang, T., Huang, D., Yaps, A., . . . ENGINEERING, E. &. C. (2014). Characterization and physical origin of fast vth Transient in NBTI of pMOSFETs with SiON dielectric.

Chicago Style Citation

Shen, C., M.-F Li, C.E Foo, T. Yang, D.M Huang, A. Yaps, G.S Samudra, Y.-C Yeo, and ELECTRICAL & COMPUTER ENGINEERING. Characterization and Physical Origin of Fast Vth Transient in NBTI of PMOSFETs With SiON Dielectric. 2014.

MLA引文

Shen, C., et al. Characterization and Physical Origin of Fast Vth Transient in NBTI of PMOSFETs With SiON Dielectric. 2014.