Chua, C., Chor, E., Yu, J., Pradeep, Y., Chan, L., & ENGINEERING, E. &. C. (2014). Effects of microtrenching from polysilicon gate patterning on 0.13μm MOSFET device performance.
Chicago Style CitationChua, C.S., E.F Chor, J. Yu, Y. Pradeep, L. Chan, and ELECTRICAL & COMPUTER ENGINEERING. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
MLA CitationChua, C.S., et al. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
Warning: These citations may not always be 100% accurate.