APA استشهاد

Chua, C., Chor, E., Yu, J., Pradeep, Y., Chan, L., & ENGINEERING, E. &. C. (2014). Effects of microtrenching from polysilicon gate patterning on 0.13μm MOSFET device performance.

استشهاد بنمط شيكاغو

Chua, C.S., E.F Chor, J. Yu, Y. Pradeep, L. Chan, و ELECTRICAL & COMPUTER ENGINEERING. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.

MLA استشهاد

Chua, C.S., et al. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.

تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.