Chua, C., Chor, E., Yu, J., Pradeep, Y., Chan, L., & ENGINEERING, E. &. C. (2014). Effects of microtrenching from polysilicon gate patterning on 0.13μm MOSFET device performance.
استشهاد بنمط شيكاغوChua, C.S., E.F Chor, J. Yu, Y. Pradeep, L. Chan, و ELECTRICAL & COMPUTER ENGINEERING. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
MLA استشهادChua, C.S., et al. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.