Chua, C., Chor, E., Yu, J., Pradeep, Y., Chan, L., & ENGINEERING, E. &. C. (2014). Effects of microtrenching from polysilicon gate patterning on 0.13μm MOSFET device performance.
Chicago Style CitationChua, C.S., E.F Chor, J. Yu, Y. Pradeep, L. Chan, and ELECTRICAL & COMPUTER ENGINEERING. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
MLA引文Chua, C.S., et al. Effects of Microtrenching From Polysilicon Gate Patterning On 0.13μm MOSFET Device Performance. 2014.
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