Ang, K., Wan, C., Chui, K., Tung, C., Balasubramanian, N., Li, M., . . . ENGINEERING, E. &. C. (2014). Hot carrier reliability of strained N-MOSFET with lattice mismatched source/drain stressors.

Ang, K.-W., C. Wan, K.-J Chui, C.-H Tung, N. Balasubramanian, M.-F Li, G. Samudra, Y.-C Yeo, و ELECTRICAL & COMPUTER ENGINEERING. Hot Carrier Reliability of Strained N-MOSFET With Lattice Mismatched Source/drain Stressors. 2014.

Ang, K.-W., et al. Hot Carrier Reliability of Strained N-MOSFET With Lattice Mismatched Source/drain Stressors. 2014.