Text this: In-situ surface passivation and metal-gate/high-k dielectric stack formation for N-channel gallium arsenide metal-oxide-semiconductor field-effect transistors

 __   _     ______    _____      ___      ______  
| || | ||  /_   _//  / ____||   / _ \\   /_   _// 
| '--' ||   -| ||-  / //---`'  | / \ ||    | ||   
| .--. ||   _| ||_  \ \\___    | \_/ ||   _| ||   
|_|| |_||  /_____//  \_____||   \___//   /__//    
`-`  `-`   `-----`    `----`    `---`    `--`