Text this: In-situ surface passivation and metal-gate/high-k dielectric stack formation for N-channel gallium arsenide metal-oxide-semiconductor field-effect transistors

  ____       ___      _____     _____     _____   
 |  _ \\    / _ \\   |__  //   |  ___||  / ____|| 
 | |_| ||  / //\ \\    / //    | ||__   / //---`' 
 | .  //  |  ___  ||  / //__   | ||__   \ \\___   
 |_|\_\\  |_||  |_|| /_____||  |_____||  \_____|| 
 `-` --`  `-`   `-`  `-----`   `-----`    `----`