APA Citation

Zhang, Y., Bower, A., Xia, L., Shih, C., & (ENGINEERING), D. O. (2014). Three dimensional finite element analysis of the evolution of voids and thin films by strain and electromigration induced surface diffusion.

Chicago Style Citation

Zhang, Y.W., A.F Bower, L. Xia, C.F Shih, and DEAN'S OFFICE (ENGINEERING). Three Dimensional Finite Element Analysis of the Evolution of Voids and Thin Films By Strain and Electromigration Induced Surface Diffusion. 2014.

MLA Citation

Zhang, Y.W., et al. Three Dimensional Finite Element Analysis of the Evolution of Voids and Thin Films By Strain and Electromigration Induced Surface Diffusion. 2014.

Warning: These citations may not always be 100% accurate.