發送短信 : Oxygen-vacancy-related relaxation and scaling behaviors of Bi 0.9La0.1Fe0.98Mg0.02O3 ferroelectric thin films

           __   __   _____     _    _     ______  
    ___    \ \\/ // |  __ \\  | || | ||  /_   _// 
   /   ||   \ ` //  | |  \ || | || | ||    | ||   
  | [] ||    | ||   | |__/ || | \\_/ ||   _| ||   
   \__ ||    |_||   |_____//   \____//   /__//    
    -|_||    `-`'    -----`     `---`    `--`     
     `-`