Taijing, L., Ng, S., & PHYSICS. (2014). Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometer.
استشهاد بنمط شيكاغوTaijing, Lu, S.C Ng, و PHYSICS. Characterization of Striations in Silicon Wafers By a Multipass Fabry-Perot Rayleigh-Brillouin Scattering Spectrometer. 2014.
MLA استشهادTaijing, Lu, S.C Ng, و PHYSICS. Characterization of Striations in Silicon Wafers By a Multipass Fabry-Perot Rayleigh-Brillouin Scattering Spectrometer. 2014.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.