High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures

10.1016/S0168-583X(02)00470-6

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Bibliographic Details
Main Authors:	Osipowicz, T., Seng, H.L., Wielunski, L.S., Tok, E.S., Breton, G., Zhang, J.
Other Authors:	PHYSICS
Format:	Conference or Workshop Item
Published:	2014
Subjects:	Channeling contrast microscopy Virtual substrate
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/98740
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-98740
record_format	dspace
spelling	sg-nus-scholar.10635-987402023-10-26T08:32:03Z High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures Osipowicz, T. Seng, H.L. Wielunski, L.S. Tok, E.S. Breton, G. Zhang, J. PHYSICS MATERIALS SCIENCE Channeling contrast microscopy Virtual substrate 10.1016/S0168-583X(02)00470-6 Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 190 1-4 345-350 NIMBE 2014-10-16T09:50:52Z 2014-10-16T09:50:52Z 2002-05 Conference Paper Osipowicz, T., Seng, H.L., Wielunski, L.S., Tok, E.S., Breton, G., Zhang, J. (2002-05). High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 190 (1-4) : 345-350. ScholarBank@NUS Repository. https://doi.org/10.1016/S0168-583X(02)00470-6 0168583X http://scholarbank.nus.edu.sg/handle/10635/98740 000176108800068 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Channeling contrast microscopy Virtual substrate
spellingShingle	Channeling contrast microscopy Virtual substrate Osipowicz, T. Seng, H.L. Wielunski, L.S. Tok, E.S. Breton, G. Zhang, J. High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
description	10.1016/S0168-583X(02)00470-6
author2	PHYSICS
author_facet	PHYSICS Osipowicz, T. Seng, H.L. Wielunski, L.S. Tok, E.S. Breton, G. Zhang, J.
format	Conference or Workshop Item
author	Osipowicz, T. Seng, H.L. Wielunski, L.S. Tok, E.S. Breton, G. Zhang, J.
author_sort	Osipowicz, T.
title	High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
title_short	High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
title_full	High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
title_fullStr	High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
title_full_unstemmed	High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures
title_sort	high resolution channeling contrast microscopy and channeling analysis of sige quantum well structures
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/98740
_version_	1781786940346990592

High resolution channeling contrast microscopy and channeling analysis of SiGe quantum well structures

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