Novel Regrowth-Free Vertical Active-Passive Integration Scheme with Improved Fabrication Tolerance
We present a novel vertically-coupled active-passive integration architecture that provides an order of magnitude reduction in coupling coefficient variation between misaligned waveguides when compared with a conventional vertically-coupled structure.
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Main Authors: | TEE, Chyng Wen, Williams, K. A., Penty, R. V., White, I. H., Troppenz, U., Hamacher, M., Heidrich, H. |
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格式: | text |
語言: | English |
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Institutional Knowledge at Singapore Management University
2005
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在線閱讀: | https://ink.library.smu.edu.sg/lkcsb_research/3350 https://doi.org/10.1109/QELS.2005.1548992 |
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機構: | Singapore Management University |
語言: | English |
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